As a result of the development of artificial nails, the need to measure the surface condition of the nails has increased. At the same time, the measurement of skin relief through replicas remains widely used, due to several advantages. In these two cases, Eotech offers a 3D imaging solution by fringe projection featuring an unmatched resolution: the EvaSURF. This scanner is mounted on a geared column oriented towards the surface to be measured. Its narrow field of view (25x20mm), well adapted to the nails as to the replicas, allows to reach a lateral resolution of 10μm and a z-resolution lower than 1μm. In combination with the AEVA scan and analysis software, it quantifies skin micro-relief, pores and ridges and provides highly accurate 3D visuals.

CONTACT

Edouard MACE, Sales Manager

edouard.mace@eotech.fr

https://eotech.fr

👉 Read the ZOOM#33